W-SEM, FEG-SEM and UHR-SEM

The VEGA series was designed with respect to a wide range of SEM applications and needs in today’s research and industry.

This new generation of MIRA field emission scanning electron microscopes provides users with the advantages of the latest technology, such as new improved high-performance...

MAIA3 from TESCAN is a newly developed analytical scanning electron microscope which demonstrates ultra-high resolution of 1 nm at 15 kV. The resolution performance at 1 kV is 1.4...