World's first fully-integrated Scanning Electron Microscope and Raman Imaging.

RISE Microscopy is a novel correlative microscopy technique that combines SEM and confocal Raman Imaging. Through Raman Imaging and Scanning Electron Microscopy ultra-structural surface properties can be linked to molecular compound information.

RISE Microscopy on graphene. Left: SEM image of a graphene sample. Middle: Color-coded confocal Raman image. The colors display the graphene layers and wrinkles. Image parameters: 20 μm x 20 μm, 150 x 150 pixels = 22,500 spectra, integration time: 0.05 s/spectrum. Right: SEM image overlaid with the confocal Raman image.

Raman-SEM image overlay of a hamster brain tissue sample. Color-coded Raman image parameters: Green: White brain matter; Red: Gray brain matter; 100 µm x 100 µm, 300 x 300 pixels = 90,000 spectra, 50 ms integration time per spectrum.

The RISE Microscope combines all features of a stand-alone TESCAN SEM and the confocal Raman imaging microscope within one instrument:

  • Quick and convenient switching between SEM and Raman measurement
  • Automated sample transfer from one measuring position to the other
  • Integrated software interface for user-friendly measurement control
  • Correlation of the measurement results and image overlay
  • No compromise in SEM and Raman imaging capabilities
  • Efficient anf fast Raman mapping with the highest resolution on the market thanks to unique integration and design.