S800G A New Generation FIB/SEM from TESCAN


Equipped with a new SEM column, the S8000G let you profit and enjoy the benefits and versatility that come with field-free ultra-high resolution imaging including the analysis of mag­netic samples and live SEM monitoring of your FIB operations.

The BrightBeam™ SEM column delivers field-free ultra-high resolution imaging while maintaining universality in sample imaging and analysis

A new FIB column fitted with state-of-the-art ion optics and the gas injection system makes S8000G a world-class instrument for sample prepara­tion and nano-patterning. Novel Orage™ FIB column featuring cutting-edge ion optics achieves ultra-high resolution over the entire beam energy range

The new TESCAN Essence™ software platform is the key component which makes the TESCAN S8000 an easy-to-use microscope; excellent images can be obtained effortlessly and quickly by any user guaranteeing high productivity in your lab and minimal time-to-data.

Key S8000G Features

SEM COLUMN

  • Versatile system for unlimited applications:
  • The BrightBeam™ SEM column delivers field-free ultra-high resolution imaging. 
  • Superb image contrast and ultra-high resolution essential to resolve nano-sized features for the characterisation and analysis of nanostructures, nanoparticles, and nanomaterials as well as for failure analysis of microelectronic devices.
  • Detection system with angle-selective and energy-filtering capabilities gives you complete control on surface sensitivity and the option to explore with different contrast for sharpening your senses and deepening your insight.
  • Maximum protection for delicate specimens.
  • Excellent imaging performance at low beam energies ideal for imaging non-conducting samples and uncoated biological specimens. Variable pressure operations also available.
  • High electron beam currents up to 400 nA are advantageous for microanalytical techniques such as as CL, EDS, WDS and EBSD.
  • EquiPower™ lens technology assuring constant thermal power dissipation for excellent stability in time-consuming applica­tions such as FIB tomography or X-ray microanalysis.

FIB COLUMN

  • World-class quality in sample preparation.
  • Novel Orage™ FIB column featuring cutting-edge ion optics achieves ultra-high resolution over the entire beam energy range and excellent performance at low energies for preparing damage-free ultra-thin TEM specimens.
  • With ion beam currents up to 100 nA you can slash by half the time for completing your cross-sectioning and lamella lift-out processes.
  • Dedicated software enables you to perform three-dimension­al sample reconstructions with extreme ease and speed, and provides you with unique ultra-structural information of your samples.


SOFTWARE

  • Boosting productivity and throughput:
  • Easy-to-learn and workflow-oriented software for maximum control in all your applications and minimum time-to-result.